UN-SB25104X

For high-end PCB AOI inspection, Mini/Micro LED panel micro-defect detection, photovoltaic silicon wafer EL hidden crack inspection, narrow precision metal strip flaw detection, luxury printing anti-counterfeit texture inspection, electronic ceramic substrate microscopic inspection and high-precision linear dimension measurement of tiny electronic components.

· Developed for 66mm big frame sensor
· Low distortion
· Compatible for 16K line scan camera
· Excellent optical performance, uniform imaging of center and edge

Product information: Custom designs are available upon request.

For Intelligent Transportation Systems (ITS) Applications: Road Surveillance, ANPR/ALPR, Automatic Incident Detection, Traffic Enforcement Systems, Railway/Tunnel Safety Monitoring, etc.

· Excellent edge sharpness and uniform illumination
· Designed to resist strong light interference, adaptable to complex lighting conditions
· High stability and low distortion ensure measurement accuracy